wdk干涉測量鏡頭

適合非接觸光學(xué)壓型

可選michelson(2x and 5x) 鏡頭

f=200mm鏡筒遠(yuǎn)場校正設(shè)計(jì)

用途：
干涉測量鏡頭可用在非接觸光學(xué)壓型測量設(shè)備上，通過此鏡頭可得到表面位圖和表面測量參數(shù)等。也可用來檢測表面粗糙度，測量精度非常高，在一個(gè)波長之內(nèi)。一束光通過分光鏡，可將光直接射向樣品表面和內(nèi)置反光鏡。從樣品表面反射的光線通過再結(jié)合，就產(chǎn)生了干涉圖案。michelson鏡頭擁有更長的工作距離，更寬的視場和更大的焦深。采用f=200mm鏡筒的話可將鏡頭直接裝配到c接口相機(jī)上。
wdk interferometryobjectives

suitable fornon-contact optical profiling

michelson (2xand 5x)

infinitycorrected f=200mm tube lens design

interferometry objectives are usedin non-contact optical profile measurement devices to obtainsurface maps and surface measurement parameters. they can be usedto examine surface topography with very high precision—to within afraction of the wavelength of light. in these objectives, a lightbeam passes through a beamsplitter, which directs the light to boththe surface of the sample and a built-in reference mirror. thelight reflected from these surfaces recombines and a fringeinterference pattern is formed. the michelson objectives providecomparatively longer working distances, wider fields of view andlarger depth of focus, whereas the the f=200mm tube lens allowsthese objectives to be integrated to a c-mount camera.

技術(shù)參數(shù)：

倍率			2x		5x
na			0.055		0.14
w.d（mm）			15		15
焦點(diǎn)距離(mm)			100		40
分解能 (μm)			5		2
被寫界深度(μm)			91		14
實(shí)視場2/3" sensor(mm)			4.4 x 3.3		1.76 x 1.32
實(shí)視場1/2" sensor(mm)			3.2 x 2.4		1.28 x 0.96
重量 (g)			430		450

 

本產(chǎn)品的類型是干涉鏡頭，品牌是WDK，型號是IFSAPO，目鏡放大倍數(shù)是10X，物鏡放大倍數(shù)是5X,2X，儀器放大倍數(shù)是50X,20X，重量是200（g），適用范圍是干涉測量，裝箱數(shù)是1，加工定制是否，規(guī)格是IFSAPO2X,IFSAPO5X