afm + thermal analysis

nanoscale thermal analysis (nano-ta)

based on our proprietary thermal probe technology,the afm+ allowsyou to obtain transition temperatures on any local feature of yoursample or to obtain a transition temperature map.

an afm image with nano-ta data of a toner particle. the particlewas embedded in epoxy and microtomed. the topography of the sampleshows variations in structure, which can then be analyzed usingnano-ta. toner particles include a number of components (wax,resin, dye, etc.) that exhibit different transitiontemperatures.

scanning thermal microscopy (sthm)

this mode of the afm+ allowsyou to map relative thermal conductivity and relative temperaturedifferences across your sample.

the 4μm x 8μm image shown here utilizes the scanning thermalmicroscopy (sthm) functionality of the afm+systemon a carbon fiber – epoxy composite sample. the sample was cut andpolished to form a smooth surface. the height image (left) shows anumber of carbon fibers, while the sthm image (right) shows thechange in probe temperature on the two materials due to theirdifferences in thermal conductivity. this sample demonstrates thehigh lateral-resolution capability of theue.

transition temperature microscopy

transition temperature microscopy (ttm) is a fully automated modein which an array of nano-ta measurements are rapidly performed andeach temperature ramp is automatically analyzed to determine thetransition temperature.

an optical image and a ttm map of a banded spherulite composed ofpoly (l-lactic acid) (plla). this ttm map was created by using themotorized xy stage. the blue areas in the ttm map are amorphousplla; the red and yellow areas are crystalline areas. the“onion-like” structure in the spherulite was created by steppingthe temperature back and forth during the crystallization processto create regions with a higher or lower degree of crystallinity.sample courtesy of j. morikawa, tokyo institute oftechnology.

afm + mechanical

mechanical properties of your sample can be collected using acontact resonance method to map stiffness variations simultaneouslywith the topography.

a 4μm x 8μm topography image and stiffness map of a three-componentpolymer blend. the stiffness map, which measures the variation inmodulus by analyzing the contact resonance of the cantilever,clearly resolves the three materials.

upgradeable analytical capabilities afm + irspectroscopy

? point-and-click nanoscale ir spectroscopy

? ir spectra that correlate to ftir libraries

? chemical imaging

topography and ir images collected at 1650 cm-1 and1740 cm-1 ofstreptomyces bacteria. these bacteria form lipid-filled vesicles inlater stages of growth. the location of these vesicles can bedetermined by imaging at 1740 cm-1,an absorption band specific to the lipid. the vesicles can beresolved to sub-100nm resolution using the nanoir.

multifunctional nanoscale measurement suite

the new afm+ isfully upgradeable to our nanoir system, a probe-based measurementtool that utilizes infrared spectroscopy to reveal chemicalcomposition at the nanoscale. the nanoir also provideshigh-resolution characterization of local topographic, mechanical,and thermal properties. potential application areas span the realmsof polymer science, materials science, and life science, includingdetailed studies of structure-property correlations.

an example of the multi-property measurement capability of thenanoir system. the sample is a multilayer film composed ofpolyethylene and polypropylene. the two materials can be clearlyidentified by their unique absorption bands. in addition, thedifference in stiffness and transition temperature of the twomaterials can be measured.